MIL-DTL-53078A
4.3.1 Examination. The mounting kit shall be examined as specified in table II in the
order shown. Presence of one or more defects shall be cause for rejection.
4.3.2 Tests. The mounting kit shall be subjected to tests marked "X" in column 2 of the
table III, in the order shown. Failure of any test shall be cause of rejection.
4.4 Quality conformance inspection.
4.4.1 Sampling. Sampling for examination and test shall be in accordance with
ANSI/ASQ-Z1.4.
4.4.2 Examination. Samples selected in accordance with 4.4.1 shall be examined as
specified in 4.5. Acceptable quality levels (AQL) shall be 1.0 percent defective for major defects
and 2.5 percent defective for minor defects.
4.4.3 Tests. Samples selected in accordance with 4.4.1 shall be tested as specified in
4.5.2. AQL shall be 1.0 percent defective.
4.5 Examination procedure.
4.5.1 Examination. The mounting kit shall be examined as specified herein for the
defects found in table II.
4.5.2 Tests.
4.5.2.1 Test schedule.
4.5.3 Performance characteristics.
4.5.3.1 Input power. Unless otherwise specified (see 6.2), perform the tests specified
herein as 18.0 (+0.5, -0.0) Vdc and again at 30.0 (+0.0, -0.5) Vdc. Apply input power to the
terminals specified in 3.4.1.1 and verify assembly performance.
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